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Intelligent Manufacturing

Intelligent Manufacturing

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SYS158 High-frequency Thin-film Capacitor Automatic Sorting Machine
SYS158 high-frequency thin-film capacitor automatic sorting machine can continuously and automatically test the nine parameters of thin-film capacitors, which are low-level open circuit (C) 10kHz(D10), flashover (F0), DC withstand voltage (DCTV), AC withstand voltage (ACTV), insulation resistance (IR), 100kHz loss (D100), 1kHz loss (D1) and capacity sorting (C), and then automatically make test sub-files. The machine is controlled by PLC, the results of sorting and fault deductions are displayed on the screen, the static test in stepless variable-speed intermittent transmission is applied, and the capacity and loss is directly tested on the capacitor leads, in addition, an optional data set print system can be equipped with.
 
 
SYS168 Thin-film Capacitor Automatic Sorting Machine
SYS168 thin-film capacitor sorting machine can continuously and automatically test the eight parameters of thin-film capacitors, which are low-level open circuit (Co), DC flashover (FO), DC withstand voltage (DCTV), AC withstand voltage (ACTV), insulation resistance (IR) , 40kHz loss (D1), 1kHz loss (D2) and capacity sorting (△C), and then automatically make test sub-files. The machine is controlled by PLC, and the transmission is intermittent and stepless variable-speed. And the machine is characterized in high precision, high speed, high stability and reliability, with advanced technologies used for high-frequency measuring, and is indispensable electronic process equipment in the modern production of thin-film capacitors.
 
 
Capacitor Safety Performance Test device
The test device complies with the requirements of GB/T144721998 (IEC384-14), and is used for safety performance test of Class X capacitors. The test device is of a destructive test (impulse voltage test and spontaneous combustion test) function and a non-destructive test (charge-discharge test) function, as well as waveform detection and print functions.
 
 

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